• BS, Physics, Imperial College of Science and Technology, 1981
• MS, Solid State Physics, Khartoum University, 1984
• MS, Electrical Engineering, Southern Illinois University, 1995
• Ph D, Engineering Science, The Pennsylvania State University, 2002

Book Reviews

Samia A Suliman, 2012, Silicon Photonics: for telecommunication and biomedicine

Samia A Suliman, 2011, Fundamentals of Strength of Materials by Nag and Chanda

Journal Articles

J. Hao, M Rioux, Samia A Suliman and Osama O Awadelkarim, 2014, "High temperature bias-stress-induced instability in power trench-gated MOSFETs", MICROELECTRONICS RELIABILITY

K. Sarpatwar, L. J. Passmore, Samia A Suliman and O. O. Awadelkarim, 2007, "The analysis of current-voltage-temperature characterization in SiC Schottky diodes using threshold-accepting simulated-annealing technique", Solid State Electronics, 51, (5), pp. 644-649

Karthik Sarpatwar, Lucas Passmore, Samia A Suliman and Osama Awadelkarim, 2007, "Analysis of Current-Voltage-Temperature Characteristics in SiC Schottky Diodes Using Threshold- Accepting Simulated-Annealing Techniques,", SOLID-STATE ELECTRONICS

Lucas Passmore, Karthik Sarpatwar, Samia A Suliman and Osama Awadelakrim, 2006, "Fowler-Nordheim and Hot Carrier Reliabilities of U-Shaped Trench-Gated Transistors Studied by Three Terminal Charge Pumping"

Lucas Passmore, Karthik Sarpatwar, Samia A Suliman and Osama Awadelakrim, 2005, "Modified three terminal charge pumping technique applied to vertical transistor structures"

Samia A Suliman, Osama O Awadelkarim, R Ridley and G Donley, 2004, "Gate-oxide grown on the sidewalls and base of U-shaped Si trench: Effects of the oxide and oxide /Si interface condition on the properties of vertical MOS devices"

Samia A Suliman, Osama Awadelakarim and Stephen Fonash, 2003, "Electrical properties of the gate oxide and its interface with Si in U-shaped trench MOS capacitors: The impact of polycrystalline Si doping and oxide composition"

Samia A Suliman, Osama Awadelkarim and Stephen Fonash, 2002, "Electron and hole trapping in the bulk and interface with Si of a thermal oxide grown on the sidewalls and base of a U-shaped silicon trench"

Samia A Suliman, Osama Awadelakarim and Stephen Fonash, 2001, "The dependence of UMOSFETs characteristics and reliability on geometry and processing"

Samia A Suliman, 2001, "The effects of channel boron-doping on the performance and reliability of N-channel trench UMOSFETs"

Osama Awadelkarim, Samia A Suli andan, , 1990, "Defect states in carbon and oxygen implanted p-type silicon"

Osama Awadelkarim, Samia A Suliman and Bo Monemar, 1989, "On the 0.34 eV hole trap in irradiated boron-doped silicon"

Conference Proceedings

Samia A Suliman, 2014, "High-Temperature Reverse- Bias stressing of thin Oxide in Power Transistors", Conference: 12th Symposium on Semiconductors, Dielectrics, and Metals for Nanoelectronics held during the 226th Meeting of The Electrochemical-Society Location: Cancun, MEXICO Date: OCT 05-10, 2014

Clifford Lissenden, Christine Masters and Samia A Suliman, 2011, "Supplemental learning tools for Statics and Strength of Materials"

Samia A Suliman, 2006, "Properties of Si/SiO2Interfaces in Vertical Trench MOSFETs", IEEE, International Workshop on Junction Technology, 2006, IWJT '06, pp. 225-228

Osama Awadelkarim and Samia A Suliman, 2006, "Current- voltage characteristics and charge-carrier traps in n-type 4H-SiC Schottky structures - (invited", The 6th International Workshop on Junction Technology, Shanghai-China Session: Heterojunction Device and Contact

Samia A Suliman, 2006, "The properties of Si/SiO2 interfaces in Vertical trench UMOSFETS;Silicon-Based Novel Structures and Devices"

Samia A Suliman, 2005, "Fowler-Nordheim and Hot Carrier Reliabilities of U-Shaped Trench-Gated Transistors Studied by Three Terminal Charge Pumping"

Samia A Suliman, 2005, "On the Reliability of U-Shaped Trench-Gated Metal- Oxide Silicon Field-Effect Transisto", On the Reliability of U-Shaped Trench-Gated Metal- Oxide Silicon Field-Effect Transistor

C Wu, Samia A Suliman, Osama Awadelakrim and Jerzy Ryzyllo, 2002, "Growth and reliability of thick gate oxide in U-trench for power MOSFET's"

Gary Dolny and Samia A Suliman, 2001, "Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETS using the charge-pumping technique"

Samia A Suliman, Stephen Fonash and Osama Awadelkarim, 2001, "The impact of trench geometry and processing on performance and reliability of low voltage power UMOSFETs"

Service to Penn State:

• Administrative Support Work, Evaluator, SHC- admission evaluator, SHC, December 2017 - January 2018

• Contribution to Programs to Enhance Equal Opportunity/Cultural Diversity, Committee Member, MEP-Director Search Committee, December 2017 - February 2018

• Committee Work, Committee Member, CoE faculty Senator, Faculty Senate, Undergraduate Education, June 2016 - June 2019

• Committee Work, Administrator, Evaluated startegic plans for set of the 48 univerity units., Framework for Diversity, September 2014 - December 2014

• Contribution to Programs to Enhance Equal Opportunity/Cultural Diversity, Co-Chairperson, Faculty committee co-chair, Executive member, CFW - Commission for Women, January 2013

• Contribution to Programs to Enhance Equal Opportunity/Cultural Diversity, Participant, meetings, International, May 2008

• Assistance to Student Organizations, Evaluator, Judge on CoE-CERS- program, April 2016

• Contribution to Programs to Enhance Equal Opportunity/Cultural Diversity, Diversity Training, May 2016

• Committee Work, Presenter, Faculty Workload Committee, June 2016

Service to External Organizations:

• Other, Attendee, July 2015

• Service to Governmental Agencies, Panelist, NSF-GRFP, October 2003