Book Review
- Samia A Suliman, 2012, Silicon Photonics: for telecommunication and biomedicine
- Samia A Suliman, 2011, Fundamentals of Strength of Materials by Nag and Chanda
Journal Article
- J. Hao, M Rioux, Samia A Suliman and Osama O Awadelkarim, 2014, "High temperature bias-stress-induced instability in power trench-gated MOSFETs", MICROELECTRONICS RELIABILITY
- K. Sarpatwar, L. J. Passmore, Samia A Suliman and O. O. Awadelkarim, 2007, "The analysis of current-voltage-temperature characterization in SiC Schottky diodes using threshold-accepting simulated-annealing technique", Solid State Electronics, 51, (5), pp. 644-649
- Karthik Sarpatwar, Lucas Passmore, Samia A Suliman and Osama Awadelkarim, 2007, "Analysis of Current-Voltage-Temperature Characteristics in SiC Schottky Diodes Using Threshold- Accepting Simulated-Annealing Techniques,", SOLID-STATE ELECTRONICS
- Lucas Passmore, Karthik Sarpatwar, Samia A Suliman and Osama Awadelakrim, 2006, "Fowler-Nordheim and Hot Carrier Reliabilities of U-Shaped Trench-Gated Transistors Studied by Three Terminal Charge Pumping"
- Lucas Passmore, Karthik Sarpatwar, Samia A Suliman and Osama Awadelakrim, 2005, "Modified three terminal charge pumping technique applied to vertical transistor structures"
- Samia A Suliman, Osama O Awadelkarim, R Ridley and G Donley, 2004, "Gate-oxide grown on the sidewalls and base of U-shaped Si trench: Effects of the oxide and oxide /Si interface condition on the properties of vertical MOS devices"
- Samia A Suliman, Osama Awadelakarim and Stephen Fonash, 2003, "Electrical properties of the gate oxide and its interface with Si in U-shaped trench MOS capacitors: The impact of polycrystalline Si doping and oxide composition"
- Samia A Suliman, Osama Awadelkarim and Stephen Fonash, 2002, "Electron and hole trapping in the bulk and interface with Si of a thermal oxide grown on the sidewalls and base of a U-shaped silicon trench"
- Samia A Suliman, Osama Awadelakarim and Stephen Fonash, 2001, "The dependence of UMOSFETs characteristics and reliability on geometry and processing"
- Samia A Suliman, 2001, "The effects of channel boron-doping on the performance and reliability of N-channel trench UMOSFETs"
- Osama Awadelkarim, Samia A Suli andan, , 1990, "Defect states in carbon and oxygen implanted p-type silicon"
- Osama Awadelkarim, Samia A Suliman and Bo Monemar, 1989, "On the 0.34 eV hole trap in irradiated boron-doped silicon"
Conference Proceeding
- Samia A Suliman, 2014, "High-Temperature Reverse- Bias stressing of thin Oxide in Power Transistors", Conference: 12th Symposium on Semiconductors, Dielectrics, and Metals for Nanoelectronics held during the 226th Meeting of The Electrochemical-Society Location: Cancun, MEXICO Date: OCT 05-10, 2014
- Clifford Lissenden, Christine Masters and Samia A Suliman, 2011, "Supplemental learning tools for Statics and Strength of Materials"
- Samia A Suliman, 2006, "Properties of Si/SiO2Interfaces in Vertical Trench MOSFETs", IEEE, International Workshop on Junction Technology, 2006, IWJT '06, pp. 225-228
- Osama Awadelkarim and Samia A Suliman, 2006, "Current- voltage characteristics and charge-carrier traps in n-type 4H-SiC Schottky structures - (invited", The 6th International Workshop on Junction Technology, Shanghai-China Session: Heterojunction Device and Contact
- Samia A Suliman, 2006, "The properties of Si/SiO2 interfaces in Vertical trench UMOSFETS;Silicon-Based Novel Structures and Devices"
- Samia A Suliman, 2005, "Fowler-Nordheim and Hot Carrier Reliabilities of U-Shaped Trench-Gated Transistors Studied by Three Terminal Charge Pumping"
- Samia A Suliman, 2005, "On the Reliability of U-Shaped Trench-Gated Metal- Oxide Silicon Field-Effect Transisto", On the Reliability of U-Shaped Trench-Gated Metal- Oxide Silicon Field-Effect Transistor
- C Wu, Samia A Suliman, Osama Awadelakrim and Jerzy Ryzyllo, 2002, "Growth and reliability of thick gate oxide in U-trench for power MOSFET's"
- Gary Dolny and Samia A Suliman, 2001, "Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETS using the charge-pumping technique"
- Samia A Suliman, Stephen Fonash and Osama Awadelkarim, 2001, "The impact of trench geometry and processing on performance and reliability of low voltage power UMOSFETs"
