The 43rd Annual Technical Meeting of the Society of Engineering Science
August 13-16, 2006
University Park, Pennsylvania

<< Previous Symposium  List All Symposia  Next Symposium >>
Symposium: Particle Systems Characterization and Modeling
Organizer: Virendra M. Puri, Pennsylvania State University

Description: This symposium provides a forum for sharing and exchange of information on recent advances in the field of measurement methods and computational process models for particle systems comprising nano to micron size particulates. The scope of measurement methods is intended to cover all aspects of particles and particle systems corresponding to unit operations and applications of importance in a diverse set of particulate materials industries. Accordingly, the focus of these measurement methods should be to characterize the fundamental behavior of particle systems including mechanical, chemical, thermal, electrical, magnetic, and optical responses. Likewise, the scope of computational process models is intended to cover all aspects of particle systems from particles through product formation. These process models may have a multiplicity of end uses including analysis, design, synthesis, and troubleshooting. Toward this end, presentations are invited on innovative approaches with emphasis on, but not limited to, 3D measurement methods such as static and dynamic characterization, non-invasive and non-contact techniques, on-line and off-line methods, real-time bulk powder characterization, and other innovative devices. Additionally, presentations are invited on current and emerging topics with emphasis on, but not limited to, PC-based computational process models such as multi-scale formulations, multi-component systems, real-time implementation for on-line or off-line monitoring and control, intelligent decision making, 3D visualization and animation for quality evaluation.



<< Previous Symposium  List All Symposia  Next Symposium >>