Dr. Patrick Lenahan, Distinguished Professor in Engineering Science and Mechanics, will travel to Santa Fe, New Mexico on January 8 to present two talks at the Physics and Chemistry Semiconductor Interface Conference.

The annual PCSI conference is devoted to achieving a fundamental understanding of the physical, chemical, biological, structural, optical, magnetic and electrical properties of surfaces and interfaces. These studies include characterization of growth processes, interfacial phenomena, transport and the structure and influence of defects. To learn more about the conference, please visit their web site.