Jason T. Ryan, (Ph.D., MatSc), will be presenting a paper titled "Electron Spin Resonance Studies of Silicon Nano-Crystal Flash Memory Devices" at the Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (IEEE UCSI) Conference, July 28 - August 23, 2007, in Barga, Italy. The paper was co-authored with P.M. Lenahan (Penn State Professor of Engineering Science and Mechanics), L. Visnubhotla, S. Straub, M. Ramachandran, R. Rao, and T. Merchant (all of Freescale Semiconductor).