Dr. Srikanth Krishnan received his B.Tech in Electrical Engineering from the Indian Institute of Technology (IIT), Madras (India), (1985), and his M.S. (1988) and Ph.D. (1992) degrees in Engineering Science at The Pennsylvania State University with emphasis on Ion Beam interaction with Silicon. Subsequently, he joined the Plasma Etch group at the Semiconductor Process and Design Center (SPDC), Texas Instruments, to research plasma damage effects on transistor performance. In 1998, he joined the Reliability Group within Texas Instruments and led the 130 nm component reliability effort.

Dr. Krishnan is currently Device Reliability Manager, responsible for component reliability of all CMOS technology nodes at Texas Instruments. During his 14-year career at Texas Instruments, he has authored 30 papers (6 invited), 17 patents, and 1 trade secret. He also earned his Masters in Business Administration from Southern Methodist University in 2000.

Dr. Krishnan has served on the technical program committee for IRPS since 1999 and the Management Committee since 2003. He has served on The International Workshop on Physics of Semiconductor Devices committee as the ULSI session chair. Dr. Krishnan served on the program committee of the Plasma Process-Induced Damage Symposium (P2ID) and was Vice-Chair and Chair for P2ID in 2003-2004.

Dr. Krishnan’s wife, Uma, is a Post-Doctoral Fellow (Genetics) at the University of Texas Southwest Medical Center (UTSWMC), Dallas. During his spare time, Dr. Krishnan enjoys reading and playing soccer with his six-year old son, Siddharth, and two-year old daughter, Nethra.

NOTE: Two of our Centennial Fellows are spotlighted each week.