Jason Campbell, Engineering Science and Mechanics doctoral student, has been awarded the outstanding paper for his paper titled "NBTI: An Atomic-Scale Defect Perspective". The paper was presented at the IEEE International Reliability Physics Conference in San Jose, CA, March 26 - 30, 2006.

The paper was co-authored with Patrick M. Lenahan (Penn State, Department of Engineering Science and Mechanics) and A. T. Krishnan and S. Krishnan (Texas Instruments).