Dr. Patrick Lenahan and his students, Mark Anders, Mike Mutch, Thomas Pomorski and Liam Young, attended the 55th Electronic Materials Conference and the Device Research Conference at the University of Notre Dame in South Bend, Indiana on June 25-29, 2013. Mark Anders presented on "Electrically Detected Magnetic Resonance Study Comparing 4H SiC n- and p- MOSFETs." Thomas Pomorski presented on "ESR and SDT Studies of BEOL (Low-K) Dielectrics and Etch Stop Layers." Dr. Lenahan presented a paper on "Zero Field and Low Field Spin Dependent Transport in MOS Devices: A New Tool for the Study of Dielectric/Semiconductor Interface and Dielectric Defects," and chaired a session on "Oxide Thin-Film Integration—Alternative Dielectrics, Epitaxial Oxides, Multifunctional Oxides, Superlattices and Metal Gates."